NACMA @ NIST Meet the Speakers

Mr. Dean Beutel (speaker)

Mr. Dean Beutel is the Director, Caterpillar Production System (CPS) Deployment – Americas, for 35 years he has been adding operational excellence to Caterpillar.


  • 1978 - 1984 Machinist Apprentice – Journeyman
  • 1984 – 1990 Manufacturing & Quality Engineering, Hydraulics
  • 1990 – 2000 Manufacturing R&D – Internal Mfg Consulting
  • 2000 – 2003 Manufacturing R&D, Division Manager
  • 2003 – 2008 Technical Services Mgr, Track Type Tractors
  • 2008 – 2010 Caterpillar Production System Global Quality, Mgr
  • 2011 - 2013 CPS Deployment and Global Facilities Management

Outstanding achievements:

  • Mid 1980's: Lean flow: via combination turning/drilling/milling
  • Late 80's: Quality information "intranet" (coordinate measuring machines)
  • 90's: Corporate User Groups: Metrology, Machine tool, Tooling
  • 90's: International metrology & manufacturing consulting
  • 90's: International recruiting / Relationships with strategic Universities
  • Early 2000's: Manufacturing Equipment – Strategic supplier relationships
  • 2003 – 2008: Tractor facility modernization ($240M update of large scale Fabrication, automated Gear manufacturing and Heat Treatment systems)
  • 2008 – 2010: Developed Caterpillar Quality Management System
  • 2010 – 2013: Cat Production System Lean Execution ($200M value)

Mr. Dean Beutel

Mr. Dean Beutel

Mr. Kostadin Doytchinov (speaker, NACMA officer)

Mr. Kos Doytchinov, president of Kotem Technologies Inc holds MS Degree in mechanical engineering (precision mechanics and optics). During his 30 years of metrology experience he has been working in various positions in research institutes and industry. On the research side he has been involved in geometrical tolerance determination in CMM design, software compensation methods for geometrical and thermal errors. He was a Senior Research Officer (for 18 years) at the Institute for National Measurement Standards, National Research Council Canada – responsible for CMM metrology,1D, 2D and 3D measurements, roundness and roughness measurements. On the industrial side: software development – mathematics for metrology and GD&T, metrology systems troubleshooting and consulting. Kos is the founder of Kotem Technologies Inc.

Others Activities include:

  • Vice-Chairman of NACMA (North American Coordinate Metrology Association),
  • Canadian Representative at the ISO/TC213/WG18, WG2 – Datums, Geometrical Tolerancing; Technical Auditor for Standards Council of Canada – ISO 17025;
  • Member of ASME B89.7 committee

He has given numerous metrology courses, workshops and conference presentations in many countries

Mr. Kostadin Doytchinov

Mr. Kostadin Doytchinov

Dr. Greg Hetland (speaker, NACMA officer)

Dr. Hetland, president of the International Institute of Geometric Dimensioning & Tolerancing, has 30+ years' experience in the medical, disc-drive, aerospace, defense and commercial industries with extensive expertise in the Mechanical and Precision Engineering fields as an Engineer, Manager, Consultant, Educator and Author.

Dr. Hetland is a recognized leader in the dimensional tolerancing and physical metrology fields with extensive technical society affiliations. He is recognized worldwide as chairman and member of U.S. committees as well as U.S. representative on international standards' development in the areas of physical metrology, dimensional tolerancing and uncertainty analysis, with emphasis in the sub-micrometer regime.

Dr. Hetland consults in the areas of corporate technology forecasting, advanced measurement development, advanced mechanical design and modeling techniques, physical measurement strategies and uncertainty analysis. Dr. Hetland also teaches fundamental to advanced courses in Geometric Dimensioning and Tolerances both as public and in-house seminars around the world.

Dr. Greg Hetland

Dr. Greg Hetland

Dr. Ed Morse (speaker)

Dr. Morse received his Bachelor of Science degree in Mechanical Engineering from Swarthmore College in June of 1985. After pursuing personal interests for three and one half years, he was accepted in the Master of Engineering program at Cornell University. It was during this two-semester program that he was first exposed to the fields of geometric modeling, tolerancing, and metrology. This exposure and subsequent interest led to his employment by the Brown & Sharpe Manufacturing Company following the completion of his M.Eng. in May of 1989. He was employed by Brown & Sharpe in the Measuring Systems Division for four years, first as an Applications Engineer and then as a Design Engineer in the Advanced Systems group.

In August of 1993, he re-entered the graduate program in Mechanical Engineering at Cornell. He received his Special Masters in May of 1997, and his Ph.D. in January of 2000. He departed Cornell in October of 1999 to join the faculty at the University of North Carolina at Charlotte as an assistant professor. He was granted tenure and promoted to associate professor in 2005, and promoted to full professor in 2011. His current research interests include large scale metrology, assembly modeling and analysis, machine tool metrology, uncertainty estimation and analysis, and various aspects of computational metrology.

Dr. Morse is a member of several ASME standards committees for tolerancing and metrology, and is chair of the B89 division 4 for Coordinate Measuring Machines. He is also a Subject Matter Expert (SME) representing the United States in ISO Technical Committee 213 on Geometric Product Specification and Verification.

Dr. Morse is an assessor for calibration laboratories under ISO 17025, and is also a certified GD&T professional at the senior level (ASME GDTP certificate S-0283).

Dr. Ed Morse

Dr. Ed Morse

Dr. Jim Pekelsky (speaker)

Dr. Jim Pekelsky is a dimensional metrology scientist and consultant, recently retired after 35 years with the National Research Council of Canada. At NRC, he spent ten years developing optical and digital image metrology in Photogrammetry Research, two years in Colour Vision metrology, and 23 years as Head of the Length Standards / Dimensional Metrology Group, developing expertise in lasers, gauge blocks, angle metrology, line scales, tapes, target bars, roundness, diameter, CMM artifacts, image metrology, and nanometrology.

Internationally, he was Canada's delegate for 21 years to the BIPM Consultative Committee on Length (CCL), was founding Chairman of the CCL Working Group on Dimensional Metrology (WGDM) and for the Americas regional metrology organization (SIM). He was Technical Expert for ISO 17025 audits of several national metrology institutes, including Mexico, Japan, Australia, South Korea, and South Africa, as well as auditing Canadian metrology labs.

With 175 publications in journals, conference proceedings, patents, reports, theses and book chapters, he was recipient of the 2001 NRC Outstanding Achievement Award for career-long contributions to metrology.

Jim now offers design and build, advice and teaching, through his consulting company, Canadian Dimensional Metrology, based in Ottawa. Specialties include tight-temperature-controlled lab HVAC and custom metrology instruments & software.

Dr. Jim Pekelsky

Dr. Jim Pekelsky

Dr. Steve Phillips (speaker, NACMA officer)

Dr. Phillips received his bachelors in mathematics, summa cum laude, from Washington State University. His masters and doctorate are in physics from the University of California at Santa Barbara. He also received an MBA in 2008.

Dr. Phillips holds 3 patents and has authored over 60 research publications in such diverse fields as chemistry, physics, applied optics, and precision engineering. He has previously worked as a research scientist and consultant in the optics industry and joined NIST in 1989 as a research scientist in the Dimensional Metrology Group. He is also currently serving on the board of directors of a US financial institution.

Dr. Phillips has worked as the Group Leader of the Large Scale Coordinate Metrology Group and also as the Program Manager for Dimensional Metrology at NIST. He has received the Department of Commerce's Bronze, Silver and Gold Medals for his work in dimensional metrology. He is currently the vice-chair the ASME B89 committee on dimensional metrology and the primary ANSI designated SME (subject matter expert) representing the United States at the International Standards Organization TC213-WG4 (dimensional measurement uncertainty) and TC213-WG10 (coordinate metrology) committees.

Dr. Steve Phillips

Dr. Steve Phillips

Dr. Craig Shakarji (speaker)

Dr. Craig Shakarji is a mathematician in NIST's Dimensional Metrology Group, specializing in coordinate metrology software. For 15 years Craig has led the algorithm testing program at NIST—a service that tests least-squares fitting algorithms used in coordinate metrology. He authored the chapter, "Coordinate Measuring System Algorithms and Filters" in the 2012 book, Coordinate Measuring Machines and Systems.

Craig chairs the ISO/TC 213 working group on coordinate measuring machines, which produces the ISO 10360 standard series. He also chairs the ASME B89.4 project team on CMM software and is active on several other B89 divisions. In 2011 he was awarded the Department of Commerce Gold Medal for his efforts in harmonizing CMM standards. Craig's received his Ph.D. in applied mathematics from UCLA and his masters from Caltech.

Dr. Craig Shakarji

Dr. Kim D. Summerhays (speaker)

Dr. Kim Summerhays is a co-founder of MetroSage and has served as its Technical Director for over 13 years. There he has been intimately engaged in the design and development of the MetroSage flagship software product, PUNDIT/CMM, which provides task-specific measurement uncertainty estimations for GD&T parameters evaluated using coordinate measuring machines. Kim earned his doctorate from the University of California at Davis in 1971.

Since 1973, he has been on the faculty of the University of San Francisco (USF), where he currently holds full professorships in Computer Science and Chemistry. He has also served as Associate Dean of the College of Arts and Sciences at USF, as a visiting professor at Stanford University, and as Senior Member of Technical Staff at Sandia National Laboratories, conducting research on software correction of thermally-induced errors in machine tools.

Dr. Kim Summerhays

Dr. Kim Summerhays

Mr. Keith Summers (speaker)

Mr. Keith Summers is President of Productivity Quality Inc. (PQI) and Advanced Inspection Services LLC (AIS). Both companies have a focus on the needs of manufacturer's for dimensional measurement equipment and services. PQI, founded in 1992, concentrates on product sales and AIS concentrates on contract services. Keith has worked with hundreds of companies on analyzing their requirements for automated inspection of parts of all sizes, shapes and accuracy requirements using video, laser and tactile sensors.

Prior to this, Keith was the Training Manager at DataMyte Corporation where he designed and delivered training programs for SPC data collection and prior to that was a Senior Trainer at Cummins Onan Corporation presenting training programs on power generation products. Keith has also served as an adjunct faculty member at the University of Minnesota, developing and presenting courses on manufacturing education and training and development.

Keith holds BA and MA degrees from the University of Minnesota in Industrial and Technical Education.

Mr. Keith Summers

Mr. Keith Summers

Mr. Robert Bridges (speaker)

Robert Bridges is Chief Scientist for FARO Technologies, where he is responsible for patents, standards, and technology development. He oversees FARO patent prosecution and holds more than 100 patents and patents pending in his own name. He also works on technologies for all FARO products including triangulation scanners, time-of-flight scanners, articulated arm CMMs, and laser trackers. Robert is active in ISO TC213 WG10, ASME B89.4, and ASTM E57 standards committees. He holds a Ph.D. degree in optics from The University of Rochester.

Mr. Robert Bridges

Mr. Robert Bridges

Mr. John Stoup (speaker)

John Stoup received a BS in Mechanical Engineering from University of Maryland in 1993. Started career at NIST in 1988 and has been involved in or has performed all dimensional measurements at the NMI level including gauge block and cylindrical diameter artifacts (comparison or absolute interferometry), sphere measurement, flatness, angle, roundness, small feature specialized measurements, coordinate measuring machine (CMM) measurement of artifacts for assessment of 2-D or 3-D geometrical form and size. Trained in NMI metrology by NIST experts Ralph Veale, Ted Doiron, Grace Chaconas.

Mr. Stoup is currently the NIST Dimensional Measurement Services Project Leader and responsible for development of the NIST M48 CMM's, arguably the most accurate CMMs of their size in the world. Stoup has conducted training seminars at NIST and elsewhere on dimensional measurement uncertainty, interferometric measurement techniques, gauge block measurement.

Written and presented numerous publications worldwide on CMM measurement, uncertainty, and dimensional measurements at national and international conferences (SPIE, ASPE, MSC) and journals (Metrologia, NIST Journal of Research). Mr. Stoup has personally been involved in at least six different international key comparisons and was the pilot of the key comparison of internal and external diameter.

Mr. John Stoup

Mr. John Stoup

Mr. Ray Admire (speaker)

Ray has worked for Lockheed Martin and its predecessor companies since 1985. Ray is a Coordinate measurement specialist with over twenty‐six years combined experience in the quality organization with Cartesian coordinates and computer assisted measurement systems. Ray attended Dallas Baptist University, has GD&T Level‐4 and Lean Six Sigma Green Belt Certifications. He serves as the treasurer of the DMSC (Dimensional Metrology Standards Consortium, representative for Lockheed Martin on several other standardization activities for the past eleven years (I++, DMIS) and is the Chairman of the Quality Measurement Standards Committee which oversees five working groups. Ray also leads two global collaborative groups for Missiles and Fire Control, CAV/ DISCUS‐FAI and the CMM Programming teams. He currently serves on the board for the management association. Ray has also been the chairman of the Quality Mission Success Golf Tournament for the past 8 events and has risen over $40,000 for local charities.

Ray and Tanya Admire celebrated their twenty‐fifth anniversary this year and have two sons, Spencer (23) and Austin (18). Ray enjoys golfing, traveling drinking wine and spending time with his family.

Mr. Ray Admire

Mr. Ray Admire

NACMA @ NIST Organizers

Dr. Miguel Viliesid (NACMA, officer)

Dr. Miguel Viliesid has a Bachelors degree in Mechanical Engineering from the Universidad Autónoma Metrolpolitana Azcapotzalco (UAM-A) in Mexico City. He then obtained a Diplôme d'Études Apporfindies (DEA) in Vibrations and Oscillators followed by a PhD in Experimental Modal Analysis from the Faculté de Science et des Techniques de Franche-Comté in France.

Miguel worked for several years at the Insituto de Investigaciones eléctricas (IIE), a research center for the utility industry in Mexico, on projects related to steam generators, piping flexibility and flow induced vibrations in piping.

Miguel joined the Centro Nacional de Metología (CENAM), the National Metrology Institute (NMI) of Mexico since its foundation in 1993, where he has been the head of the Dimensional Metrology Section for already 20 years. He was responsible of the setup of the Dimensional Metrology laboratories, hiring personnel, implementation of the quality system, establishment of measurement capabilities and their related uncertainties being able to prove them through several international comparisons.

Miguel has published papers related to metrology, uncertainty estimation and laboratory comparisons in different international journals. He has also been representing his institute at the Comité Internationale de Logueurs (CCL) from the International Committee of Weighs and Measures (CIPM) since 1997 and has piloted several international comparisons. He joined NACMA since 2007 as the Mexican Vice-chairman for the Mexican Section. He has organized two international conferences of the organization in Mexico (2009 and 2012), and was nominated president of NACMA for the period 2011-2012.

Dr. Miguel Viliesid

Dr. Miguel Viliesid


The 2013 NACMA officers are members of national laboratories and industry leaders:

CENAM IIGDT Kotem Technologies NIST
Centro Nacional de Metrología (CENAM),
International Institute of Geometric Dimensioning & Tolerancing (IIGDT), USA Kotem Technologies Inc.,
National Institute of Standards and Technology (NIST),