Agenda

 
Tuesday September 23rd, 2014
18:00 - 20:00 "Meet and Greet" in the Paris Room inside the International Plaza. Meet your speakers, organizers and network with your metrology colleagues.

Brought to you by the generous support:Helmel Engineering

Wednesday September 24th, 2014
08:00 - 09:00 Exhibits & Coffee
09:00 - 09:10 Welcome and Announcements
  Mr. Kos Doytchinov
Kotem Technologies
Chair NACMA 2014 Workshop and Conference
09:10 - 09:40 Keynote Speaker
  Mr. Mark Lewis
VP Tooling and Services, Candu Energy
09:40 - 10:40 Free form surface Measurement Technology Oveview
  Dr. Prof. Simone Carmignato
University of Padova, Italy
10:40 - 11:10 Break and Exhibits
11:10 - 12:10 CT Scanners
  Dr. Marcin Bauza
Director of New Technology and Innovation, Zeiss
12:10 - 12:40 Accuracy of x-ray computed tomography in industrial metrology
  Dr. Prof. Simone Carmignato
University of Padova, Italy
12:40 - 13:50 Lunch / Exhibitions
13:50 - 14:30 Gage Repeatability and Reproducibility Studies and Task Specific Measurement Uncertainty
  Mr. Keith Summers
Productivity Quality Inc.
14:30 - 15:15 CMMs, AACMMs, and Laser Trackers : Know the Errors Sources and Improve Accuracy
  Dr. Steven Phillips
National Institute of Standards and Technology, NIST
15:15 - 15:45 Break & Exhibits
15:45 - 16:10 Evaluating CT for metrology: the influence of material thickness on measurements
  Dr. Joe Schlecht
North Star Imaging
16:10 - 17:10 Computed Tomography Open panel discussion
Thursday September 25th, 2014
8:00 - 09:00 Exhibits & Coffee
9:00 - 9:40 Evaluating CMM Probes Probe Heads, and Styli
  Dr. Ed Morse
University of North Carolina at Charlotte (UNCC)
9:40 – 10:00 Probe Qualification - explaining the reason for the bi-directional errors
  Mr. Kos Doytchinov
Kotem Technologies
10:00 – 10:30 Measurement Sampling Strategies
  Dr. Steven Phillips
National Institute of Standards and Technology, NIST
10:30 – 11:00 Break and Exhibits
11:00 - 11:50 In Process Closed Loop Metrology for Adaptive Manufacturing
  Mr. Ray Karadayi
President & CEO - Applied Automation Technologies, Inc.
11:50 - 12:30 Verification of an Articulated Arm Coordinate Measuring Machine by means of an Indexed Metrology Platform
  Dr. Agustín Brau Avila
University of Sonora, Mexico
12:30 - 13:50 Lunch & Exhibits, Brought to you by the
generous support: Zeiss
13:50 - 14:20 How can Profile Tolerancing can be used to minimize inspection and throughput time when compared to linear tolerancing. A cost benefit analysis will be presented to contrast the two approaches.
  Mr. Jim Stertz
Director of Quality/Technology, Lowell Inc.
14:20 - 14:50 Interim testing strategies for Coordinate Measuring Machines
  Dr. Ed Morse
University of North Carolina at Charlotte (UNCC)
15:00 - 15:30 Break and Exhibits
15:30 - 16:50 Analysis of Profile for Proof of Compliance vs Process & Design Feedback
  Dr. Greg Hetland
International Institute of Geometric Dimensioning and Tolerancing, USA
16:50 - 17:00 Final Announcements and Close Workshop
Agenda: Friday September 26th, 2014
08:00 - 08:30 Meet in Exhibitors Room (where NACMA exhibits were shown)
08:30 - 09:00 Shuttle Bus to Candu
09:00 - 11:30 Candu Energy Tours
11:30 - 12:00 Shuttle Bus back to International Plaza

Download the current Agenda

 

Agenda in PDF form

 

 

 

 

 

 

 

 

 

 

 

 

   
   

The 2014 NACMA officers are members of national laboratories and industry leaders:

CENAM IIGDT Kotem Technologies NIST
Centro Nacional de Metrología (CENAM),
Mexico
International Institute of Geometric Dimensioning & Tolerancing (IIGDT), USA Kotem Technologies Inc.,
Canada
National Institute of Standards and Technology (NIST),
USA