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NACMA Annual Workshop and Conference
In Conjunction with Simposio Metrologia 2012
October 8-12, 2012
Santiago de Querétaro, Qro, Mexico
Workshop and Conference • Introduction to Simposio Metrologia 2012


NACMA, together with CENAM, would like to cordially invite you to annual Workshop and Conference October 8 & 9.

This internationally recognized annual workshop, in its 18th year, will offer presentations given by renowned metrology experts from around the world. Lectures will cover basic subjects in coordinate metrology including probing, GD&T, Y14.5, ISO, CMM–CAD integration and laser scanning, and address recent developments in instrumentation, standards and procedures.

This year NACMA has joined Simposio de Metrologia 2012 under the slogan "Innovation in measurements for a better quality of life", which will take place in the Misión Juriquilla Hotel city of Santiago de Querétaro, Mexico from October 10 – 12, 2012

Make the best of your visit by attending the Simposio. The objective of the Symposium is to provide a forum where researchers, instructors, manufacturers and suppliers of measuring instruments, as well as users with practical experience from metrology and testing laboratories and research institutions, education, accreditation and standardization organizations, discuss the most recent advances and applications in measurements for a better quality life.

The National Institute of Metrology of Mexico, Centro Nacional de Metrologia, (CENAM), is the coordinating sponsor of this event.

NACMA 2012 Location

Misión Querétaro Juriquilla Hotel

NACMA has made special arrangements with Hotel Mision Queretaro Juriquilla, located 25 minutes from colonial downtown of Querétaro City (25 km).

The Hotel Mision Querataro Juriquilla is imbued with colonial charm. Constructed in the main house of an 18th century Hacienda, this Queretaro hotel offers elegant architecture, spacious accommodations, dining and event space for leisure and business travel to this capital city of Queretaro Mexico.

Blvd. Villas del Mesón No. 56
Postal code 76230
Queretaro, Querétaro
Phone: 52 (442) 234-00-00
Fax: 52 (442) 234-02-97

Speaker at Podium This years Workshop and Conference being held in Santiago de Querétaro, Mexico, promises to be an informative and educational event. Speakers from across the world will be presenting provocative information that affects our industry, metrology.
Dr. Greg Hetland—President International Institute of Geometric Dimensioning and Tolerancing (IIGDT), USA
Presenting : Profile Tolerancing: Proof of Compliance - vs.- Process Feedback

Mr. Kostadin Doytchinov—President KOTEM Technologies, Inc., Hungary
Presenting : GD&T versus Manufacturing and SPC

Bertrand Gili—President & CEO, METROLOGIC Group Services, Inc, USA
Presenting : New Concepts for Inspection Analysis directly using Specialized Software and Laser Scanning

Leonardo Espinosa—Soporte CMM, Mexico
Edgar Arizmendi—CENAM, Mexico
Presenting : Practical considerations in the evaluation of Large CMM's under ASME B89.4.10360.2-2008 and ISO 10360-2: 2009

Ramón Zeleny—MITUTOYO Mexicana S.A. de C.V., Mexico
Presenting : Measurement System Capability Analysis
Alfonso Cotera
Presenting : Evaluation of CMM Measurement System According to VDA 5
Dr. Steven Phillips—National Institute of Standards and Technology, NIST, USA
Presenting : Laser Trackers and Laser Scanners for large scale coordinate metrology
Dr. Eugen Trapet—TRAPET Metrology, Spain
Presenting : Verification of Large CMMs by means of artifacts
Raghuram Bhogaraju—ZEISS, USA
Presenting : Innovative and Adaptive Image Processing Techniques for CT-Metrology
Octavio Icasio—Centro Nacional de Metrología, CENAM
Dr. Miguel Viliesid
—Centro Nacional de Metrología, CENAM

Presenting : Active Stereoscopy Three-dimensional Measurement Accuracy Test of a Low-Cost Experimental Setup

Download a complete Agenda here.

PDF Download

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Instructions for Registration can be found here:

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General Information on Fees

Sponsors of NACMA and Simposio Metroligia 2012
Interested in becoming a NACMA Sponsor?
basculas-revuelta   cidesi   sym   merk
ets-lingren   fluke   renishaw   Agilent
qdas   mettler   perkinElmer   Rossvach
Zeiss   metas   fonkel   Mb instrumentos
mahr   IOPP   dual brand   mabrex
volumex   rhode   ciateq   3clogo
insco   tmyc   fujisan   byasa
ATL   cip   mitutoyo   E2000 mex
    inceleris   MetriSoft   mitutoyo
Promoters of Simposio Metroligia 2012
    concyteq   conacyt    

Registration Information:

Fabiola Hernández Guerrero
Tel. +52 (442) 211 05 00 al 04, ext. 3013
Fax: +52 (442) 216-2626